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Results 1-10 of 10 (Search time: 0.007 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
Analysis of single-layered multiconductor transmission lines using the fourier transform and mode-matching techniques

Park, HH; Kwon, JH; Lee, JW; Eom, Hyo Joon, MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.36, no.4, pp.315 - 317, 2003-02

2
Shielding effectiveness of enclosure with thick multiple apertures

Lee, JG; Eom, Hyo Joon; Kim, BW; Park, HH, MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.29, no.3, pp.178 - 181, 2001-05

3
Electromagnetic scattering from multiple rectangular apertures in a thick conducting screen

Park, HH; Eom, Hyo Joon, IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, v.47, no.6, pp.1056 - 1060, 1999-06

4
Electromagnetic penetration into a rectangular cavity with multiple rectangular apertures in a conducting plane

Park, HH; Eom, Hyo Joon, IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.42, no.3, pp.303 - 307, 2000-08

5
Electromagnetic penetration into 2-D multiple slotted rectangular cavity: TW-wave

Park, HH; Eom, Hyo Joon, IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, v.48, no.2, pp.331 - 333, 2000-02

6
Acoustic scattering from two junctions in a rectangular waveguide

Kwon, JY; Park, HH; Eom, Hyo Joon, JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, v.103, no.2, pp.1209 - 1212, 1998-02

7
Acoustic scattering from a rectangular aperture in a thick hard screen

Park, HH; Eom, Hyo Joon, JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, v.101, no.1, pp.595 - 598, 1997-01

8
Electrostatic potential distribution through thick multiple rectangular apertures

Park, HH; Eom, Hyo Joon, ELECTRONICS LETTERS, v.34, no.15, pp.1500 - 1501, 1998-07

9
Surface crack detection using flanged parallel-plate waveguide

Park, HH; Cho, YH; Eom, Hyo Joon, ELECTRONICS LETTERS, v.37, no.25, pp.1526 - 1527, 2001-12

10
Electrostatic potential distribution through a rectangular aperture in a thick conducting plane

Park, HH; Eom, Hyo Joon, IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.44, no.10, pp.1745 - 1747, 1996-10

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