DSpace at KOASAS: Search

Results 1-2 of 2 (Search time: 0.005 seconds).

NO	Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1	Demonstration of a Curable Nanowire FinFET Using Punchthrough Current to Repair Hot-Carrier Damage Park, Jun-Young; Hur, Jae; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.39, no.2, pp.180 - 183, 2018-02
2	Curing of Hot-Carrier Induced Damage by Gate-Induced Drain Leakage Current in Gate-All-Around FETs Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12

Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)

Park, Jun-Young; Hur, Jae; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.39, no.2, pp.180 - 183, 2018-02

Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12

Discover

KOASAS