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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Demonstration of a Curable Nanowire FinFET Using Punchthrough Current to Repair Hot-Carrier Damage Park, Jun-Young; Hur, Jae; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.39, no.2, pp.180 - 183, 2018-02 |