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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| A New Charge-Pumping Technique for a Double-Gated SOI MOSFET Using Pulsed Drain Current Transients Kim, Sung-Ho; Choi, Sung-Jin; Moon, Dong-Il; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.59, no.1, pp.241 - 246, 2012-01 | |
| Silicon Nanowire All-Around Gate MOSFETs Built on a Bulk Substrate by All Plasma-Etching Routes Moon, Dong-Il; Choi, Sung-Jin; Kim, Chung-Jin; Kim, Jee-Yeon; Lee, Jin-Seong; Oh, Jae-Sub; Lee, Gi-Sung; Park, Yun-Chang; Hong, Dae-Won; Lee, Dong-Wook; Kim, Young-Su; Kim, Jeoung-Woo; Han, Jin-Woo; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.32, no.4, pp.452 - 454, 2011-04 | |
| Optically Assisted Charge Pumping on Floating-Body FETs Kim, Sung-Ho; Choi, Sung-Jin; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.31, no.12, pp.1365 - 1367, 2010-12 | |
| Highly durable and flexible memory based on resistance switching Kim, Sung-Ho; Yarimaga, Oktay; Choi, Sung-Jin; Choi, Yang-Kyu, SOLID-STATE ELECTRONICS, v.54, no.4, pp.392 - 396, 2010-04 | |
| High-Performance Polycrystalline Silicon TFT on the Structure of a Dopant-Segregated Schottky-Barrier Source/Drain Choi, Sung-Jin; Han, Jin-Woo; Kim, Sung-Ho; Moon, Dong-Il; Jang, Moon-Gyu; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.31, no.3, pp.228 - 230, 2010-03 | |
| Interface-Trap Analysis by an Optically Assisted Charge-Pumping Technique in a Floating-Body Device Kim, Sung-Ho; Choi, Sung-Jin; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.32, no.1, pp.84 - 86, 2011-01 | |
| Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs Moon, Joon-Bae; Moon, Dong-Il; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.61, no.3, pp.1420 - 1425, 2014-06 | |
| Low-Frequency Noise Characteristics in SONOS Flash Memory With Vertically Stacked Nanowire FETs Bang, Te-Wook; Lee, Byung-Hyun; Kim, Choong-Ki; Ahn, Dae-Chul; Jeon, Seung-Bae; Kang, Min-Ho; Oh, Jae-Sub; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.38, no.1, pp.40 - 43, 2017-01 | |
| Investigation of Self-Heating Effects in Gate-All-Around MOSFETs With Vertically Stacked Multiple Silicon Nanowire Channels Park, Jun-Young; Lee, Byung-Hyun; Chang, Ki Soo; Kim, Dong Uk; Jeong, Chanbae; Kim, Choong-Ki; Bae, Hagyoul; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.11, pp.4393 - 4399, 2017-11 | |
| Comprehensive Analysis of Gate-Induced Drain Leakage in Vertically Stacked Nanowire FETs: Inversion-Mode Versus Junctionless Mode Hur, Jae; Lee, Byung-Hyun; Kang, Min-Ho; Ahn, Dae-Chul; Bang, Tewook; Jeon, Seung-Bae; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.37, no.5, pp.541 - 544, 2016-05 |
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