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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Highly Biased Linear Condition Method for Separately Extracting Source and Drain Resistance in MOSFETs Kim, Gun-Hee; Bae, Hagyoul; Hur, Jae; Kim, Choong-Ki; Lee, Geon-Beom; Bang, Tewook; Son, Yoon-Ik; Ryu, Seong-Wan; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.2, pp.419 - 423, 2018-02 | |
| Quantitative analysis of trap states through the behavior of the sulfur ions in MoS2 FETs following high vacuum annealing Bae, Hagyoul; Jun, Sungwoo; Kim, Choong-Ki; Ju, Byeong-Kwon; Choi, Yang-Kyu, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.51, no.10, 2018-03 |
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