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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Curing of Hot-Carrier Induced Damage by Gate-Induced Drain Leakage Current in Gate-All-Around FETs Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12 | |
A Comparative Study of the Curing Effects of Local and Global Thermal Annealing on a FinFET Park, Jun-Young; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.7, no.1, pp.954 - 958, 2019-08 | |
| Demonstration of Thermally-Assisted Programming with High Speed and Improved Reliability for Junctionless Nanowire NOR Flash Memory Yu, Ji-Man; Park, Jun-Young; Lee, Geon-Beom; Han, Joon-Kyu; Kim, Myung-Su; Hur, Jae; Yun, Dae-Hwan; Kim, Seong-Yeon; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.18, pp.1110 - 1113, 2019-10 | |
| Joule-Heated and Suspended Silicon Nanowire Based Sensor for Low-Power and Stable Hydrogen Detection Yun, Jeonghoon; Ahn, Jae-Hyuk; Moon, Dong-Il; Choi, Yang-Kyu; Park, Inkyu, ACS APPLIED MATERIALS & INTERFACES, v.11, no.45, pp.42349 - 42357, 2019-11 | |
| Si-MoS2 Vertical Heterojunction for Photodetector with High Responsivity and Low Noise Equivalent Power Shin, Gwang Hyuk; Park, Jung Hoon; Lee, Khang June; Lee, Geon-Beom; Jeon, Hyun Bae; Choi, Yang-Kyu; Yu, Kyoungsik; Choi, Sung-Yool, ACS APPLIED MATERIALS & INTERFACES, v.11, no.7, pp.7626 - 7634, 2019-01 |
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