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NO	Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1	Suppression of Self-Heating Effects in 3-D V-NAND Flash Memory Using a Plugged Pillar-Shaped Heat Sink Park, Jun-Young; Yun, Dae-Hwan; Kim, Seong-Yeon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.2, pp.212 - 215, 2019-02
2	Curing of Hot-Carrier Induced Damage by Gate-Induced Drain Leakage Current in Gate-All-Around FETs Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12
3	A Comparative Study of the Curing Effects of Local and Global Thermal Annealing on a FinFET Park, Jun-Young; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.7, no.1, pp.954 - 958, 2019-08

Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)

Park, Jun-Young; Yun, Dae-Hwan; Kim, Seong-Yeon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.2, pp.212 - 215, 2019-02

Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12