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Results 51-58 of 58 (Search time: 0.004 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
51
Co-integrated Neuromorphic Devices for Bio-inspired Compliance Control

Shin, Hery; Yu, Ji-Man; Han, Joon-Kyu; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.22, pp.706 - 712, 2023-11

52
A Single MOSFET-Based Oscillator on a Bulk-Silicon Wafer

Kim, Hae Yeon; KIM, Seung Il; Han, Joon-Kyu; Jung, Jin-Woo; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.45, no.1, pp.8 - 11, 2024-01

53
Bio-Inspired Organic Synaptor with in-situ ion-Doped Ultrathin Polyelectrolyte Containing Acetylcholine-like Cation

Yu, Ji-Man; Kim, You-Son; Lee, Chang-Hyeon; Jeong, Boo-Seok; Kim, Jin-Ki; Han, Joon-Kyu; Yang, Jung-Yeong; Yun, Seong-Yun; Im, Sung-Gap; Choi, Yang-Kyu, Small, 2024-02

54
A Nanoscale Bistable Resistor for an Oscillatory Neural Network

Yun, Seong-Yun; Han, Joon-Kyu; Choi, Yang-Kyu, NANO LETTERS, v.24, no.19, pp.2751 - 2757, 2024-03

55
High-Pressure Deuterium Annealing for Trap Passivation for a 3-D Integrated Structure

Lee, Jung-Woo; Han, Joon-Kyu; Wang, Dong-Hyun; Yun, Seong-Yun; Oh, Jeong-Seob; Bang, Byeong-Chan; Cha, Won-Hyo; Park, Jun-Young; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.71, no.4, pp.2801 - 2804, 2024-04

56
Self-Curable Synaptor With Tri-Node Charge-Trap FinFET for Semi-Supervised Learning

Yu, Ji-Man; Ham, Gyeong-Do; Kim, Seong-Yeon; KIM, Jin-Ki; Han, Joon-Kyu; Yun, Seong-Yun; Kim, Seong-Hak; Lee, Sang-Won; Jeon, Seung-Bae; Kim, Dae-Shik; Choi, Yang-Kyu, IEEE Electron Device Letters, v.45, no.4, pp.716 - 719, 2024-04

57
An artificial olfactory sensory neuron for selective gas detection with in-sensor computing

Lee, Sang-Won; Kang, Mingu; Han, Joon-Kyu; Yun, Seong-Yun; Park, Inkyu; Choi, Yang-Kyu, Device, v.1, no.3, 2023-09

58
Vertically Integrated CMOS Ternary Logic Device with Low Static Power Consumption and High Packing Density

Han, Joon-Kyu; Lee, Jung Woo; Kim, Young Bin; Yun, Seong-Yun; Yu, Jiman; Lee, Keon Jae; Choi, Yang-Kyu, ACS APPLIED MATERIALS & INTERFACES, v.15, no.44, pp.51429 - 51434, 2023-10

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