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Modeling and Analysis of Through-Silicon Via (TSV) Noise Coupling and Suppression Using a Guard Ring Cho, Jong-Hyun; Song, Eak-Hwan; Yoon, Ki-Hyun; Pak, Jun-So; Kim, Joo-Hee; Lee, Woo-Jin; Song, Tai-Gon; et al, IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.1, no.2, pp.220 - 233, 2011-02 |
Near-field and far-field analyses of alternating impedance electromagnetic bandgap (AI-EBG) structure for mixed-signal applications Choi, Jinwoo; Kam, Dong Gun; Chung, Daehyun; Srinivasan, Krishna; Govind, Vinu; Kim, Joungho; Swaminathan, Madhavan, IEEE TRANSACTIONS ON ADVANCED PACKAGING, v.30, no.2, pp.180 - 190, 2007-05 |
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