Browse "EE-Journal Papers(저널논문)" by Subject leakage currents
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| Characterization of current injection mechanism in Schottky-barrier metal-oxide-semiconductor field-effect transistors Choi, Sung-Jin; Han, Jin-Woo; Jang, Moon-Gyu; Choi, Chel-Jong; Choi, Yang-Kyu, APPLIED PHYSICS LETTERS, v.95, no.8, 2009-08 |
| HfO2/HfOxNy/HfO2 Gate Dielectric Fabricated by In Situ Oxidation of Plasma-Enhanced Atomic Layer Deposition HfN Middle Layer Maeng, W. J.; Gu, Gil Ho; Park, C. G.; Lee, Kayoung; Lee, Taeyoon; Kim, Hyungjun, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.156, no.8, pp.G109 - G113, 2009 |
| Structural and compositional dependence of gadolinium-aluminum oxide for the application of charge-trap-type nonvolatile memory devices Park, Young-Min; Park, Jong-Kyung; Song, Myeong-Ho; Lim, Sung-Kyu; Oh, Jae-Sub; Joo, Moon-Sig; Hong, Kwon; et al, APPLIED PHYSICS LETTERS, v.96, no.5, 2010-02 |
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