Browse "EE-Journal Papers(저널논문)" by Subject body-tied

Showing results 1 to 1 of 1

1
A study of negative-bias temperature instability of SOI and body-tied FinFETs

Lee, HJ; Lee, CH; Park, DG; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.26, no.5, pp.326 - 328, 2005-05

Discover

Type

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0