Browse "EE-Journal Papers(저널논문)" by Subject bias temperature instability
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| Bias Temperature Instability of a-IGZO TFTs Under Repeated Stress and Recovery Jeong, Yonghee; Kim, Hyunjin; Oh, Jungyeop; Choi, Sung-Yool; Park, Hamin, JOURNAL OF ELECTRONIC MATERIALS, v.52, no.6, pp.3914 - 3920, 2023-06 |
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