Browse "EE-Journal Papers(저널논문)" by Subject bias stress
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| Bi-directional threshold voltage shift of amorphous InGaZnO thin film transistors under alternating bias stress Kim, Hyunjin; Kim, Beom Jung; Oh, Jungyeop; Choi, Sung-Yool; Park, Hamin, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.39, no.2, 2024-02 |
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