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Enhanced bolometric properties of nickel oxide thin films for infrared image sensor applications by substitutional incorporation of Li Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.44, no.7, pp.7808 - 7813, 2018-05 |
Sputtering pressure dependent bolometric properties of Ni1-xO thin films for uncooled bolometer applications Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.43, no.12, pp.9498 - 9504, 2017-08 |
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