Browse "EE-Journal Papers(저널논문)" by Subject AFM
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| Atomic force microscope probe tips using heavily boron-doped silicon cantilevers realized in a (110) bulk silicon wafer Cho, Il-Joo; Park, Eun-Chul; Hong, Songcheol; Yoon, Euisik, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.12B, pp.7103 - 7107, 2000-12 |
| Effect of substrate temperature on polycrystalline Cd0.9Zn0.1Te thin films studied by Raman scattering spectroscopy Sridharan, M; Mekaladevi, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.39, pp.328 - 332, 2004-04 |
| New surface treatment method for improving the interface characteristics of CdTe/Hg1-xCdxTe heterostructure Lee, SH; Shin, H; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.26, no.6, pp.556 - 560, 1997-06 |
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