Browse "EE-Journal Papers(저널논문)" by Subject ACCURATE
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| Analytical drain thermal noise current model valid for deep submicron MOSFETs Han, Kwang-Seok; Shin, Hyung-Cheol; Lee, Kwy-Ro, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.51, pp.261 - 269, 2004-02 |
| Area-Efficient Approach for Generating Quantized Gaussian Noise Choi, Jaejoon; Jung, Jaehwan; Park, In-Cheol, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.63, no.7, pp.1005 - 1013, 2016-07 |
| DSPU: An Efficient Deep Learning-Based Dense RGB-D Data Acquisition With Sensor Fusion and 3-D Perception SoC Im, Dongseok; Park, Gwangtae; Ryu, Junha; Li, Zhiyong; Kang, Sanghoon; Han, Donghyeon; Lee, Jinsu; et al, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.58, no.1, pp.177 - 188, 2023-01 |
| Offset Aperture : A Passive Single-Lens Camera for Depth Sensing Khan, Muhammad Umar Karim; Khan, Asim; Lim, Jinyeon; Hamidov, Said; Choi, Won-Seok; Yun, Woojin; Lee, Yeongmin; et al, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY, v.29, no.5, pp.1380 - 1393, 2019-05 |
| Outlier-Robust Student’s-t-based IMM-VB Localization for Manned Aircraft Using TDOA Measurements Youn, Wonkeun; Huang, Yulong; Myung, Hyun, IEEE-ASME TRANSACTIONS ON MECHATRONICS, v.25, no.3, pp.1646 - 1658, 2020-06 |
| Revisiting Binary Code Similarity Analysis using Interpretable Feature Engineering and Lessons Learned Kim, Dongkwan; Kim, Eunsoo; Cha, Sang Kil; Son, Sooel; Kim, Yongdae, IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, v.49, no.4, pp.1661 - 1682, 2023-04 |
Unsupervised deep learning for depth estimation with offset pixels Imran, Saad; Bin Mukarram, Sikander; Khan, Muhammad Umar Karim; Kyung, Chong-Min, OPTICS EXPRESS, v.28, no.6, pp.8619 - 8639, 2020-03 |
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