Browse "EE-Journal Papers(저널논문)" by Subject 1/f noise parameter
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| Bolometric properties of reactively sputtered TiO2-x films for thermal infrared image sensors Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.48, no.35, 2015-09 |
| Substrate temperature dependent bolometric properties of TiO2-x films for infrared image sensor applications Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.42, no.15, pp.17123 - 17127, 2016-11 |
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