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EFFECT OF STRESS SIGN AND FILM THICKNESS ON INTERFACE NUCLEATION OF MISFIT DISLOCATIONS IN STRAINED MULTILAYERS

Park, HyoHoon; YOO, JB; OH, DK; KIM, JS; Lee, JeongYong, JOURNAL OF APPLIED PHYSICS, v.75, no.10, pp.4990 - 4993, 1994-05

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