Browse "EE-Journal Papers(저널논문)" by Author Nix, WD

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An analysis technique for extraction of thin film stresses from x-ray data

Cornella, G; Lee, Seok-Hee; Nix, WD; Bravman, JC, APPLIED PHYSICS LETTERS, v.71, no.20, pp.2949 - 2951, 1997-11

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