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ANALYTICAL MODEL FOR P-CHANNEL MOSFETS MOON, BJ; PARK, CK; RHO, KM; Lee, Kwyro; SHUR, M; FJELDLY, TA, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.38, no.12, pp.2632 - 2646, 1991-12 |
EXTRINSIC VERSUS INTRINSIC MODELS FOR FETS YTTERDAL, T; FJELDLY, TA; Lee, Kwyro, PHYSICA SCRIPTA, v.54, pp.139 - 140, 1994 |
NEW APPROACH FOR MODELING OF CURRENT DEGRADATION IN HOT-ELECTRON DAMAGED LDD NMOSFETS YTTERDAL, T; KIM, SH; Lee, Kwyro; FJELDLY, TA, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.42, no.2, pp.362 - 365, 1995-02 |
UNIFIED QUASI-STATIC MOSFET CAPACITANCE MODEL RHO, KM; Lee, Kwyro; SHUR, M; FJELDLY, TA, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.40, no.1, pp.131 - 136, 1993-01 |
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