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Analysis of 1/f noise in LWIR HgCdTe photodiodes Bae, SH; Lee, SJ; Kim, YH; Lee, Hee Chul; Kim, Choong Ki, JOURNAL OF ELECTRONIC MATERIALS, v.29, no.6, pp.877 - 882, 2000-06 |
Surface leakage current analysis of ion implanted ZnS-passivated n-on-p HgCdTe diodes in weak inversion Kim, YH; Bae, SH; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.29, no.6, pp.832 - 836, 2000-06 |
Ultraviolet photon induced bulk, surface and interface modifications in n-Hg0.8Cd0.2Te in hydrogen environment Agnihotri, OP; Pal, R; Yang, KD; Bae, SH; Lee, SJ; Lee, MY; Choi, WS; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.7A, pp.4500 - 4502, 2002-07 |
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