Browse "EE-Journal Papers(저널논문)" by Type Article

Showing results 3601 to 3620 of 14178

3601
Characteristics of a wall voltage during sustain period in AC plasma display panels

Shin, BJ; Choi, Kyung Cheol; Whang, KW, IEEE TRANSACTIONS ON PLASMA SCIENCE, v.33, pp.964 - 968, 2005-04

3602
Characteristics of AlGaAs/InGaAs/GaAs pseudomorphic HEMTs with wide head T-shaped gate fabricated by optimized dose split E-beam lithography

Lee, JH; Yoon, HS; Choi, SS; Park, Chul Soon; Pyun, KE; Park, HM, COMPOUND SEMICONDUCTORS 1995, v.145, pp.809 - 812, 1996-01

3603
Characteristics of an address discharge in ac plasma display panels

Shin, BJ; Choi, Kyung Cheol; Tae, HS; Park, SS, IEEE TRANSACTIONS ON PLASMA SCIENCE, v.33, pp.1426 - 1430, 2005-08

3604
Characteristics of an area-variable varactor diode

Kim, DW; Lee, JJ; Kwon, YS; Hong, Songcheol, IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.44, no.11, pp.2053 - 2057, 1996-11

3605
Characteristics of charged and metastable species in micro-discharges of AC-plasma display panel

Choi, Kyung Cheol; Rhee, BJ; Lee, HN, IEEE TRANSACTIONS ON PLASMA SCIENCE, v.31, pp.329 - 332, 2003-06

3606
Characteristics of ferroelectric transistors with BaMgF4 dielectric

Lyu, Jong-Son; Jeong, Jin-Woo; Kim, Kwang-Ho; Kim, Bo-Woo; Yoo, Hyung Joun, ETRI JOURNAL, v.20, no.2, pp.241 - 249, 1998-06

3607
Characteristics of gradually doped LWIR diodes by hydrogenation

Kim, Y.-H.; Kim, T.-S.; Redfern, D.A.; Musca, C.A.; Lee, Hee Chul; Kim, Choong Ki, JOURNAL OF ELECTRONIC MATERIALS, v.29, no.6, pp.859 - 864, 2000-06

3608
Characteristics of hetero-structured thermoelectric devices with a-Si/Mg2Si-stacked thin film layers

Lee, Ji Hwa; Ha, Jae Kwon; Piyapatarakul, Tipat; Yoon, Chongsei; Jeon, Buil; Giwan Yoon, ELECTRONICS LETTERS, v.54, no.24, pp.1399 - 1401, 2018-11

3609
Characteristics of indium bump for flip-chip bonding used in polymeric-waveguide-integrated optical interconnection systems

Chu, KM; Lee, JS; Cho, HS; Rho, BS; Park, HyoHoon; Jeon, DukYoung, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.43, no.8B, pp.5922 - 5927, 2004-08

3610
Characteristics of piezoelectric ZnO/AlN-stacked flexible nanogenerators for energy harvesting applications

Lee, Eunju; Park, Jaedon; Yim, Munhyuk; Kim, Yeong Seon; Yoon, Giwan, APPLIED PHYSICS LETTERS, v.106, no.2, 2015-01

3611
Characteristics of polymer waveguide notch filters using thermooptic long-period gratings

Kwon, MS; Shin, Sang Yung, IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, v.11, no.1, pp.190 - 196, 2005-01

3612
Characteristics of silicon nanocrystal floating gate memory using amorphous carbon/SiO2 tunnel barrier

Baik, SJ; Lim, Koeng Su, APPLIED PHYSICS LETTERS, v.81, pp.5186 - 5188, 2002-12

3613
Characteristics of stereo images from detectors in focal plane array

Son, Jung-Young; Yeom, Seokwon; Chun, Joohwan; Guschin, Vladmir P.; Lee, Dong-Su, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, v.28, no.7, pp.1482 - 1488, 2011-07

3614
Characteristics of tunneling nitride grown by electron cyclotron resonance nitrogen plasma nitridation and its application to low voltage EEPROM

kyeong-sik min; jin-yong chung; Lee, Kwyro, JAPANESE JOURNAL OF THE APPLIED PHYSICS, v.40, no.4b, pp.2693 - 2698, 2001-04

3615
Characteristics of tunneling nitride grown by electron cyclotron resonance nitrogen-plasma nitridation and its application to low-voltage electrical erasable-programmable read-only memory

Min, KS; Chung, JY; Lee, Kwyro, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.40, no.4B, pp.2963 - 2968, 2001-04

3616
Characterization and Analysis of Deep Learning for 3D Point Cloud Analytics

Hyun, Bongjoon; Lee, Jiwon; Rhu, Minsoo, IEEE COMPUTER ARCHITECTURE LETTERS, v.20, no.2, pp.106 - 109, 2021-07

3617
Characterization and optimization of partially depleted SOI MOSFETs for high power RF switch applications

Im, Donggu; Lee, Kwyro, SOLID-STATE ELECTRONICS, v.90, pp.94 - 98, 2013-12

3618
Characterization and removal of silicon surface residue resulting from CHF3/C2F6 reactive ion etching

Park, Sin Chong, JOURNAL OF APPLIED PHYSICS, v.76, no.8, pp.4596 - 4602, 1994-01

3619
Characterization and removal of trace heavy metal contamination on Si-surface resulted from CHF3/C2F6 reactive ion etching

Lee, Chun Su; Kang, Seung Yul; Woo, Seong-Ihl; Baek, Jong Tae; Yoo, Hyung Joun, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.36, no.4A, pp.2096 - 2100, 1997-04

3620
Characterization of anhydrous HF gas-phase etching with CH3OH for sacrificial oxide removal

Lee, JH; Jang, WI; Lee, CS; Il Lee, Y; Choi, CA; Baek, JT; Yoo, Hyung Joun, SENSORS AND ACTUATORS A-PHYSICAL, v.64, no.1, pp.27 - 32, 1998-01

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