DSpace at KOASAS
College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)

EE-Conference Papers(학술회의논문)

Search for

Recent Items

rss_1.0 rss_2.0 atom_1.0

Collection's Items (Sorted by Submit Date in Descending order): 7001 to 7020 of 22915

7001
Output Enhancement of Triboelectric Energy Harvester by Micro-Porous Triboelectric Layer

Kim, Dae Won; Hwang, Byeon Woon; Han, Jin Woo; Seol, Myeong Lok; Oh, Yura; Choi, Yang Kyu, 2015 IEEE International Electron Devices Meeting, IEEE, 2015-12-08

7002
Learning a Deep Convolutional Network for Light-Field Image Super-Resolution

Yoon, Youngjin; Jeon, Hae-Gon; 이준영; 유동근; Kweon, In-So, IEEE International Conference on Computer Vision (ICCV 2015), pp.57 - 65, IEEE Computer Society and the Computer Vision Foundation (CVF), 2015-12-11

7003
Accurate Camera Calibration Robust to Defocus using a Smartphone

Ha, Hyowon; Bok, Yunsu; Joo, Kyung Don; Kweon, In-So, IEEE International Conference on Computer Vision (ICCV 2015), IEEE Computer Society and the Computer Vision Foundation (CVF), 2015-12-13

7004
High Quality Structure from Small Motion for Rolling Shutter Cameras

Im, Sung Hoon; Ha, Hyo Won; Choe, Gyeong Min; Jeon, Hae Gon; Kweon, In So, IEEE International Conference on Computer Vision (ICCV 2015), IEEE Computer Society and the Computer Vision Foundation (CVF), 2015-12-13

7005
Salient Object Detection Using HOS Based L-0 Smoothing and Shape-Aware Region Merging

Eun, Hyun Jun; Kim, Jong Hee; Kim, Chang Ick, Visual Communications and Image Processing, IEEE, 2015-12-14

7006
A Novel SSIM Index for Image Quality Assessment using a New Luminance Adaptation Effect Model in Pixel Intensity Domain

Bae, Sung Ho; Kim, Mun Churl, IEEE International Conference on Visual Communications and Image Processing, IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2015-12-14

7007
A Novel Image Quality Assessment based on an Adaptive Feature for Image Characteristics and Distortion Types

Bae, Sung Ho; Kim, Mun Churl, IEEE International Conference on Visual Communications and Image Processing, IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2015-12-15

7008
AttentionNet: AggregatingWeak Directions for Accurate Object Detection

Yoo, Donggeun; Park, Sunggyun; Lee, Joon Young; Paek, Anthony S; Kweon, In So, IEEE International Conference on Computer Vision (ICCV 2015), IEEE Computer Society and the Computer Vision Foundation (CVF), 2015-12-15

7009
Complementary Sets of Shutter Sequences for Motion Deblurring

Jeon, Hae Gon; Lee, Joon Young; Han, Yudeog; Kim, Seon Joo; Kweon, In So, IEEE International Conference on Computer Vision (ICCV 2015), IEEE Computer Society and the Computer Vision Foundation (CVF), 2015-12-16

7010
Highly Flexible Organic Light-Emitting Diodes with Conventional Transparent Conductive Oxides

Kim, Eung Jun; Yoo, Seung Hyup; Chung, Jin; Lee, Seung Won; Lee, Jae Ho; Kim, Min Cheol, The 15th International Meeting on Information Display, The Korean Information Display Society, 2015-08

7011
Real-time Personalized Facial Expression Recognition System Based on Deep Learning

Lee, In Jae; Jung, Hee Chul; Ahn, Chung Hyun; Seo, Jeon Gil; Kim, Jun Mo; Kwon, Oh Seok, International Conference on Consumer Electronics, IEEE, 2016-01

7012
Buffer insertion to remove hold violations at multiple process corners

Han, In Hak; Hyun, Dai Joon; Shin, Young Soo, 21st Asia and South Pacific Design Automation Conference, pp.232 - 237, IEEE, ACM, 2016-01-26

7013
Mask optimization for directed self-assembly lithography: inverse DSA and inverse lithography

Shin, Young Soo; Shim, Seong Bo, 21st Asia and South Pacific Design Automation Conference, pp.83 - 88, IEEE, ACM, 2016-01-26

7014
A 1.42TOPS/W Deep Convolutional Neural Network Recognition Processor for Intelligent IoT Systems

Sim, Jae Hyeong; Park, Jun Seok; Kim, Min Hye; Bae, Dong Myung; Choi, Yeong Jae; Kim, Lee Sup, 2016 IEEE ISSCC, IEEE solid-state circuits society, 2016-02-02

7015
Etch proximity correction through machine-learning-driven etch bias model

Shim, Seong Bo; Shin, Young Soo, SPIE Advanced Lithography, SPIE, 2016-02-23

7016
Integrated routing and fill for self-aligned double patterning (SADP) using grid-based design

Song, Young Soo; Lee, Jee Myung; Shin, Young Soo, SPIE Advanced Lithography, SPIE, 2016-02-24

7017
Modeling interconnect corners under double patterning misalignment

Hyun, Dai Joon; Shin, Young Soo, SPIE Advanced Lithography, SPIE, 2016-02-24

7018
Machine learning (ML)-guided OPC using basis functions of polar Fourier transform

Shim, Seongbo; Choi, Su Hyeong; Shin, Young Soo, SPIE Advanced Lithography, SPIE, 2016-02-24

7019
Redundant via insertion in directed self-assembly lithography

Shim, Seong Bo; Chung, Woo Hyun; Shin, Young Soo, Design, Automation & Test in Europe (DATE), pp.55 - 60, European Design and Automation Association (EDAA), 2016-03-15

7020
Performance Analysis of Orbital Angular Momentum Signal Using Polarization Based Uniform Circular Array

Park, Daehee; Sung, Lakju; Gil, Gye-Tae; Cho, Dong-Ho, ICTC 2015, ICTC 2015, 2015-10-28

Discover

rss_1.0 rss_2.0 atom_1.0