미세패턴 측정을 위한 주사형 터널링 현미경 원리의 응용에 관한 연구A study on application of scanning tunneling microscopy for measurement of micro-patterns
- Advisors
- 김승우researcher; Kim, Seung-Wooresearcher
- Description
- 한국과학기술원 : 정밀공학과,
- Publisher
- 한국과학기술원
- Issue Date
- 1993
- Identifier
- 68477/325007 / 000911453
- Language
- kor
- Description
학위논문(석사) - 한국과학기술원 : 정밀공학과, 1993, [ v, 55 p. ]
- Appears in Collection
- ME-Theses_Master(석사논문)
- Files in This Item
- There are no files associated with this item.
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