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ESD: Expected Squared Difference as a Tuning-Free Trainable Calibration Measure

Yoon, Hee Suk; Tee, Joshua Tian Jin; Yoon, Eunseop; Yoon, Sunjae; Kim, Gwangsu; Li, Yingzhen; Yoo, Chang-Dong, International Conference on Learning Representations (ICLR) 2023, International Conference on Learning Representations, 2023-05-02

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