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Self-Formation of Ohmic Contact for Reduction of Schottky Barrier Height in a TiN/Ti/SiO2/n-Si Structure Jeon, Chang-Hoon; Seo, Yujin; Baek, Seung-heon Chris; Cho, Byung-Jin; Lee, Seok-Hee; Choi, Yang-Kyu, The 2016 MRS Spring Meeting, The 2016 MRS Spring Meeting, 2016-03-28 |
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