Showing results 1 to 4 of 4
Buffer insertion to remove hold violations at multiple process corners Han, In Hak; Hyun, Dai Joon; Shin, Young Soo, 21st Asia and South Pacific Design Automation Conference, pp.232 - 237, IEEE, ACM, 2016-01-26 |
Calibration of interconnect corners using on-chip ring oscillators Hyun, Dai Joon; Shin, Young Soo, 12th International SoC Design Conference, pp.141 - 142, 대한전자공학회, IEEE, 2015-11-04 |
Modeling interconnect corners under double patterning misalignment Hyun, Dai Joon; Shin, Young Soo, SPIE Advanced Lithography, SPIE, 2016-02-24 |
Physical synthesis of DNA circuits with spatially localized gates Jung, Jin Wook; Hyun, Dai Joon; Shin, Young Soo, The 33rd IEEE International Conference on Computer Design , pp.280 - 286, IEEE Circuits and Systems Society, 2015-10-20 |
Discover