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A New Experimental Method (E-PLOT) to Characterize the Substrate-current and the Saturation-voltage of Fresh and Hot-Electron-Damaged nMOSFET Lee, Kwyro; Kim, S.-H.; Min, K.-S.; Hong, S.-W., Electron Devices and Materials Symposium, pp.601 - 604, 1992 |
AIM-Spice FET Device Models : New Device Modeling Approach in VLSI Era Lee, Kwyro; Kim, S.H.; Moon, K.S.; Fjeldly, T.A.; Min, K.-S.; Hong, S.-W.; Shur, M.S., Proc. Int. Sym. on Signals, Systems, and Electronics, pp.615 - 619, 1992 |
Zero-order control of boost DC-DC converter with transient enhancement using residual current Kong, T.-H.; Woo, Y.-J.; Wang, S.-W.; Hong, S.-W.; Cho, Gyu-Hyeong, 2011 IEEE International Solid-State Circuits Conference, ISSCC 2011, pp.390 - 391, IEEE, 2011-02-20 |
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