Showing results 1 to 6 of 6
A 0.7V 17fJ/Step-FOMW178.1dB-FOMSNDR10kHz-BW 560mVPPTrue-ExG Biopotential Acquisition System with Parasitic-Insensitive 421MΩ Input Impedance in 0.18m CMOS Lee, Sehwan; Choi, Yoonsung; Kim, Geunha; Baik, Seungyeob; Seol, Taeryoung; Jang, Homin; Lee, Doyoung; et al, 2022 IEEE International Solid-State Circuits Conference, ISSCC 2022, pp.336 - 338, Institute of Electrical and Electronics Engineers Inc., 2022-02 |
A 1 V 2.5 μW Fully-Differential ASK Demodulator with 12.5 pJ/bit FOM for Ultra-Low Power Biomedical Applications Baik, Seungyeob; George, Arup K.; Je, Minkyu; Lee, Junghyup, IEEE International Midwest Symposium on Circuits and Systems, IEEE, 2017-08-08 |
A 110dB-CMRR 100dB-PSRR multi-channel neural-recording amplifier system using differentially regulated rejection ratio enhancement in 0.18μm CMOS Lee, Sehwan; George, Arup K.; Lee, Taeju; Chu, Jun-Uk; Han, Sungmin; Kim, Ji-Hoon; Je, Minkyu; et al, 65th IEEE International Solid-State Circuits Conference, ISSCC 2018, pp.472 - 474, Institute of Electrical and Electronics Engineers Inc., 2018-02-14 |
A 114-aFrms-Resolution 46-NF/10-MΩ-Range Digital-Intensive Reconfigurable RC-to-Digital Converter with Parasitic-Insensitive Femto-Farad Baseline Sensing George, Arup K.; Shim, Wooyoon; Je, Minkyu; Lee, Junghyup, 32nd IEEE Symposium on VLSI Circuits, VLSI Circuits 2018, pp.157 - 158, Institute of Electrical and Electronics Engineers Inc., 2018-06-20 |
A 2.54μJ∙ppm2-FOMS Supply- and Temperature-Independent Time-Locked ΔΣ Capacitance-to-Digital Converter in 0.18-μm CMOS Baik, Seungyeob; Seol, Taeryoung; Lee, Sehwan; Kim, Geunha; Cho, SeongHwan; George, Arup K.; Lee, Junghyup, 2022 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2022, pp.114 - 115, Institute of Electrical and Electronics Engineers Inc., 2022-06 |
An ultra-low-noise differential relaxation oscillator based on a swing-boosting scheme Lee, Junghyup; George, Arup K.; Je, Minkyu, 23rd Asia and South Pacific Design Automation Conference, ASP-DAC 2018, pp.277 - 278, Institute of Electrical and Electronics Engineers Inc., 2018-01-24 |
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