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Advanced Characterization Technique for the Extraction of Intrinsic Effective Mobility in Ultra-Thin-Body Strained SOI MOSFETs

Seo, Myung Soo; Bae, Hag Youl; Jeon, Chang Hoon; Choi, Yang-Kyu; Lee, Byung Hyun, 2017 IEEE S3S Conference, IEEE, 2017-10-16

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