공간주파수 필터링을 이용한 디스플레이 소자의 빠른 패턴 검사Rapid defect inspection of display device with optical spatial filtering
- Advisors
- 김승우researcher; Kim, Seung-Wooresearcher
- Description
- 한국과학기술원 : 기계공학전공,
- Publisher
- 한국과학기술원
- Issue Date
- 2002
- Identifier
- 174487/325007 / 000955240
- Language
- kor
- Description
학위논문(박사) - 한국과학기술원 : 기계공학전공, 2002, [ ix, 112 p. ]
- Keywords
Display Device; Defect Inspection; Fourier; Optical Spatial Filtering; 푸리에; 디스플레이; 패턴 검사; 필터링; 공간주파수
- Appears in Collection
- ME-Theses_Ph.D.(박사논문)
- Files in This Item
- There are no files associated with this item.
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