고장원인이 여럿 있는 제품의 가속수명시험 설계Design of accelerated life tests for products with multiple modes of failure
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 배도선 | - |
| dc.contributor.advisor | Bai, Do-Sun | - |
| dc.contributor.author | 전영록 | - |
| dc.contributor.author | Chun, Young-Rok | - |
| dc.date.accessioned | 2011-12-14T04:16:46Z | - |
| dc.date.available | 2011-12-14T04:16:46Z | - |
| dc.date.issued | 1989 | - |
| dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=66901&flag=dissertation | - |
| dc.identifier.uri | http://hdl.handle.net/10203/41313 | - |
| dc.description | 학위논문(석사) - 한국과학기술원 : 산업공학과, 1989.2, [ [iii], 77 p. ] | - |
| dc.language | kor | - |
| dc.publisher | 한국과학기술원 | - |
| dc.title | 고장원인이 여럿 있는 제품의 가속수명시험 설계 | - |
| dc.title.alternative | Design of accelerated life tests for products with multiple modes of failure | - |
| dc.type | Thesis(Master) | - |
| dc.identifier.CNRN | 66901/325007 | - |
| dc.description.department | 한국과학기술원 : 산업공학과, | - |
| dc.identifier.uid | 000871372 | - |
| dc.contributor.localauthor | 배도선 | - |
| dc.contributor.localauthor | Bai, Do-Sun | - |
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- IE-Theses_Master(석사논문)
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