Development of UMP unbiased test procedures for the exponential mean lifetime under accelerated life testing가속수명 검사하에서 지수분포의 평균에 대한 UMP 불편 검정절차의 개발

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 581
  • Download : 0
DC FieldValueLanguage
dc.contributor.advisorYum, Bong-Jin-
dc.contributor.advisor염봉진-
dc.contributor.authorKo, Yeong-Jun-
dc.contributor.author고영준-
dc.date.accessioned2011-12-14T04:16:28Z-
dc.date.available2011-12-14T04:16:28Z-
dc.date.issued1989-
dc.identifier.urihttp://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=66880&flag=dissertation-
dc.identifier.urihttp://hdl.handle.net/10203/41292-
dc.description학위논문(석사) - 한국과학기술원 : 산업공학과, 1989.2, [ [iii], 37 p. ]-
dc.description.abstractFor the exponential lifetime, a conditional uniformly most powerful unbiased test for the mean is developed under accelerated life testing with replacement and Type-I censoring. The mean lifetime is assumed to be an exponential function of a stress. A simple sequential procedure is also developed based upon Monte Carlo simulation to construct an acceptance sampling plan.eng
dc.languageeng-
dc.publisher한국과학기술원-
dc.titleDevelopment of UMP unbiased test procedures for the exponential mean lifetime under accelerated life testing-
dc.title.alternative가속수명 검사하에서 지수분포의 평균에 대한 UMP 불편 검정절차의 개발-
dc.typeThesis(Master)-
dc.identifier.CNRN66880/325007-
dc.description.department한국과학기술원 : 산업공학과, -
dc.identifier.uid000871016-
dc.contributor.localauthorYum, Bong-Jin-
dc.contributor.localauthor염봉진-
Appears in Collection
IE-Theses_Master(석사논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0