Optimal design of accelerated life tests under periodic inspection주기적인 검사하에서의 가속수명시험의 최적설계

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An optimal accelerated life test plans is developed under periodic inspection and Type I censoring when the lifetime is exponentially distributed. The mean lifetime is assumed to be an exponential function of a stress, and the maximum likelihood estimation is used to obtain the estimates of unknown parameters at the use stress. The criterion adopted is the asymptotic variance of the estimated log mean lifetime at the use stress, and the decision variables consist of the low stress level and portions of test items allocated to each stress. Computational experiments are conducted to observe how optimal plans vary with respect to failures probabilities at the high and use stress and the number of inspections.
Advisors
Yum, Bong-Jinresearcher염봉진researcher
Description
한국과학기술원 : 산업공학과,
Publisher
한국과학기술원
Issue Date
1987
Identifier
65840/325007 / 000851421
Language
eng
Description

학위논문(석사) - 한국과학기술원 : 산업공학과, 1987.2, [ iii, 59 p. ]

URI
http://hdl.handle.net/10203/41253
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=65840&flag=dissertation
Appears in Collection
IE-Theses_Master(석사논문)
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