TCE oxidation이 interface trap density 와 minority carrier generation lifetime 에 미치는 영향Effects of TCE oxidation on interface trap density and minority carrier generation lifetime
- Advisors
- 김충기; Kim, Choong-Ki
- Description
- 한국과학기술원 : 전기 및 전자공학과,
- Publisher
- 한국과학기술원
- Issue Date
- 1981
- Identifier
- 63033/325007 / 000791120
- Language
- kor
- Description
학위논문(석사) - 한국과학기술원 : 전기 및 전자공학과, 1981.2, [ [ii], 115 p. ]
- Appears in Collection
- EE-Theses_Master(석사논문)
- Files in This Item
- There are no files associated with this item.
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