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An approach to outlier detection of software measurement data using the k-means clustering method

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Yoon, Kyung-A / Kwon, Oh-Sung / Bae, Doo-Hwanresearcher
Publisher
IEEE
Issue Date
2007-09-20
Language
ENG
Citation

1st International Symposium on Empirical Software Engineering and Measurement, ESEM 2007, pp.443 - 445

URI
http://hdl.handle.net/10203/3308
Appears in Collection
CS-Conference Papers(학술회의논문)
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