Self-supervised learning for line artifact removal in light sheet fluorescence microscopy평면조사 레이저 형광현미경의 라인 아티팩트 제거를 위한 자기지도학습

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Light sheet fluorescence microscopy (LSFM) is a microscopic technique to obtain biological images rapidly, allowing thin light sheets to pass through the plane of a sample to obtain a single two-dimensional (2D) slice image. However, during the process of illuminating the entire slice in one plane and detecting light from a direction perpendicular to it, shadow-like line artifacts can be generated when the light is blocked by structures such as blood vessels. This paper proposes a deep learning-based solution to remove the line artifacts in LSFM. The characteristics of line artifacts were utilized to separate the LSFM image into a line artifact mask and an artifact-removed image and the network was fully trained in self-supervised learning. By comparing images before and after removing line artifacts, it is shown that the proposed method effectively removed the line artifacts. If the proposed method is applied to remove line artifacts after obtaining LSFM images, it will be able to obtain high-quality biological images at a high speed.
Advisors
윤영규researcher
Description
한국과학기술원 :전기및전자공학부,
Publisher
한국과학기술원
Issue Date
2024
Identifier
325007
Language
eng
Description

학위논문(석사) - 한국과학기술원 : 전기및전자공학부, 2024.2,[iii, 41 p. :]

Keywords

평면조사 레이저 형광현미경▼a라인 아티팩트▼a아티팩트 제거▼a자기지도학습; light sheet fluorescence microscopy▼aline artifact▼aartifact removal▼aself-supervised learning

URI
http://hdl.handle.net/10203/321576
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=1096794&flag=dissertation
Appears in Collection
EE-Theses_Master(석사논문)
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