DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | 이시현 | - |
dc.contributor.author | Jang, WonJun | - |
dc.contributor.author | 장원준 | - |
dc.date.accessioned | 2024-07-25T19:31:13Z | - |
dc.date.available | 2024-07-25T19:31:13Z | - |
dc.date.issued | 2023 | - |
dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=1045901&flag=dissertation | en_US |
dc.identifier.uri | http://hdl.handle.net/10203/320671 | - |
dc.description | 학위논문(석사) - 한국과학기술원 : 전기및전자공학부, 2023.8,[iv, 23 p. :] | - |
dc.description.abstract | The threshold voltage distribution (TVD) data of NAND flash affects the reliability and lifetime prediction of data. However, the TVD data varies depending on the user’s characteristics or usage frequency, and this changes the distribution of error bits. In this paper, we propose a federated learning algorithm to solve this problem. The federated learning algorithm trains the server model by aggregating the models learned by users without collecting their data. This method is advantageous for communication efficiency and privacy protection. The proposed algorithm makes the server model mimic the error bit estimation of user models. To do this, it calculates the reliability of each user model and generates pseudo error bits by weighted averaging the estimates of reliable user models. This way, the server model can cope with various user data distributions and improve the performance of error bit estimation. The experimental results show that the proposed algorithm performs more accurate and stable error bit estimation than existing algorithms. | - |
dc.language | eng | - |
dc.publisher | 한국과학기술원 | - |
dc.subject | 산포▼a에러 비트 추정▼a연합학습▼a신뢰도▼a의사 에러 비트 | - |
dc.subject | Threshold voltage distribution▼aError bit prediction▼aFederated learning▼aReliability▼aPseudo error bits | - |
dc.title | Federated learning algorithm for predicting error bit of NAND flash threshold voltage distribution | - |
dc.title.alternative | 낸드 플래시 산포의 에러 비트 추정을 위한 연합학습 알고리즘 | - |
dc.type | Thesis(Master) | - |
dc.identifier.CNRN | 325007 | - |
dc.description.department | 한국과학기술원 :전기및전자공학부, | - |
dc.contributor.alternativeauthor | Lee, Si-Hyeon | - |
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