Apparatus for determining 3-dimensional atomic level structure and method thereof나노 입자의 3 차원 원자 단위 구조 결정 장치 및 그 결정 방법

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dc.contributor.authorYang, Yongsooko
dc.contributor.authorLee, Juhyeokko
dc.contributor.authorJeong, ChaeHwako
dc.date.accessioned2024-05-16T09:01:04Z-
dc.date.available2024-05-16T09:01:04Z-
dc.identifier.urihttp://hdl.handle.net/10203/319387-
dc.description.abstractA data generating method includes: an atomic model generating step of generating one or more three-dimensional atomic models corresponding to a nanomaterial to be measured; a three-dimensional data generating step of generating three-dimensional atomic level structure volume data corresponding to the nanomaterial to be measured based on the one or more three-dimensional atomic model; a tilt series generating step of generating a tilt series by simulating three-dimensional tomography for a plurality of different angles in a predetermined angle range for at least some of the three-dimensional atomic level structure volume data; and a three-dimensional atomic structure tomogram volume data generating step of generating a three-dimensional atomic structure tomogram volume data set by performing three-dimensional reconstruction on at least some of the three-dimensional atomic level structure volume data based on the tilt series.-
dc.titleApparatus for determining 3-dimensional atomic level structure and method thereof-
dc.title.alternative나노 입자의 3 차원 원자 단위 구조 결정 장치 및 그 결정 방법-
dc.typePatent-
dc.type.rimsPAT-
dc.contributor.localauthorYang, Yongsoo-
dc.contributor.assigneeKAIST-
dc.identifier.iprsType특허-
dc.identifier.patentApplicationNumber17132762-
dc.identifier.patentRegistrationNumber11907812-
dc.date.application2020-12-23-
dc.date.registration2024-02-20-
dc.publisher.countryUS-
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PH-Patent(특허)
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