Raman analysis of in-plane biaxial strain for Ge-on-Si lasers
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ki, Bugeun | ko |
| dc.contributor.author | Baek, Jiwoong | ko |
| dc.contributor.author | Lee, Chulwon | ko |
| dc.contributor.author | Cho, Yong-Hoon | ko |
| dc.contributor.author | Oh, Jungwoo | ko |
| dc.date.accessioned | 2023-11-22T10:00:41Z | - |
| dc.date.available | 2023-11-22T10:00:41Z | - |
| dc.date.created | 2023-11-22 | - |
| dc.date.issued | 2015-08 | - |
| dc.identifier.citation | 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/315068 | - |
| dc.description.abstract | Tensile strain of Ge-on-Si with post-growth annealing was analyzed using micro-Raman for optical sources in interconnection system. Tensile Stain in epi-Ge distributed non-linearly with SiGe alloy formation at the interface after annealing. | - |
| dc.language | English | - |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
| dc.title | Raman analysis of in-plane biaxial strain for Ge-on-Si lasers | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-84962844796 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | Busan | - |
| dc.identifier.doi | 10.1109/CLEOPR.2015.7375928 | - |
| dc.contributor.localauthor | Cho, Yong-Hoon | - |
| dc.contributor.nonIdAuthor | Ki, Bugeun | - |
| dc.contributor.nonIdAuthor | Baek, Jiwoong | - |
| dc.contributor.nonIdAuthor | Oh, Jungwoo | - |
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