Temporally Averaged Regression for Semi-Supervised Low-Light Image Enhancement

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dc.contributor.authorLee, Sunhyeokko
dc.contributor.authorJang, Dong Gonko
dc.contributor.authorKim, Dae-Shikko
dc.date.accessioned2023-11-21T08:01:03Z-
dc.date.available2023-11-21T08:01:03Z-
dc.date.created2023-11-20-
dc.date.issued2023-06-18-
dc.identifier.citation2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2023, pp.4208 - 4217-
dc.identifier.urihttp://hdl.handle.net/10203/314942-
dc.description.abstractConstructing annotated paired datasets for low-light image enhancement is complex and time-consuming, and existing deep learning models often generate noisy outputs or misinterpret shadows. To effectively learn intricate relationships between features in image space with limited labels, we introduce a deep learning model with a backbone structure that incorporates both spatial and layer-wise dependencies. The proposed model features a baseline image-enhancing network with spatial dependencies and an optimized layer attention mechanism to learn feature sparsity and importance. We present a progressive supervised loss function for improvement. Furthermore, we propose a novel Multi-Consistency Regularization (MCR) loss and integrate it within a Multi-Consistency Mean Teacher (MCMT) framework, which enforces agreement on high-level features and incorporates intermediate features for better understanding of the entire image. By combining the MCR loss with the progressive supervised loss, student network parameters can be updated in a single step. Our approach achieves significant performance improvements using fewer labeled data and unlabeled low-light images within our semi-supervised framework. Qualitative evaluations demonstrate the effectiveness of our method in leveraging comprehensive dependencies and unlabeled data for low-light image enhancement.-
dc.languageEnglish-
dc.publisherIEEE Computer Society-
dc.titleTemporally Averaged Regression for Semi-Supervised Low-Light Image Enhancement-
dc.typeConference-
dc.identifier.scopusid2-s2.0-85170825640-
dc.type.rimsCONF-
dc.citation.beginningpage4208-
dc.citation.endingpage4217-
dc.citation.publicationname2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2023-
dc.identifier.conferencecountryCN-
dc.identifier.conferencelocationVancouver-
dc.identifier.doi10.1109/CVPRW59228.2023.00443-
dc.contributor.localauthorKim, Dae-Shik-
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EE-Conference Papers(학술회의논문)
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