Electromagnetic noise effects on semiconductor system in electric vehicle

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dc.contributor.authorBae, Bumheeko
dc.contributor.authorKim, Jonghoon Jko
dc.contributor.authorKim, Sukjinko
dc.contributor.authorKong, Sunkyuko
dc.contributor.authorJung, Daniel Hko
dc.contributor.authorKim, Jounghoko
dc.date.accessioned2023-10-16T06:02:04Z-
dc.date.available2023-10-16T06:02:04Z-
dc.date.created2023-10-16-
dc.date.issued2015-01-
dc.identifier.citationDesignCon 2015-
dc.identifier.urihttp://hdl.handle.net/10203/313372-
dc.description.abstractA new modeling method is proposed to estimate the electromagnetic noise effects on an ADC in the electric vehicle. We focus on two noise sources; one is the switching noise from the automotive inverter. Second is the magnetic coupled noise from power circuit such as wireless power transmission. The ADC is fabricated using a 0.13-μm CMOS process, and the ADC is designed with a 4-layer stack-up PCB. The proposed model dramatically reduces the necessary computation time and resources without losing estimation accuracy. The proposed model is a new approach to the automotive semiconductor EMC.-
dc.languageEnglish-
dc.publisherUBM Electronics-
dc.titleElectromagnetic noise effects on semiconductor system in electric vehicle-
dc.typeConference-
dc.identifier.scopusid2-s2.0-84983201131-
dc.type.rimsCONF-
dc.citation.publicationnameDesignCon 2015-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationSanta Clara-
dc.contributor.localauthorKim, Joungho-
dc.contributor.nonIdAuthorBae, Bumhee-
dc.contributor.nonIdAuthorKim, Sukjin-
dc.contributor.nonIdAuthorJung, Daniel H-
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EE-Conference Papers(학술회의논문)
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