DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bae, Bumhee | ko |
dc.contributor.author | Kim, Jonghoon J | ko |
dc.contributor.author | Kim, Sukjin | ko |
dc.contributor.author | Kong, Sunkyu | ko |
dc.contributor.author | Jung, Daniel H | ko |
dc.contributor.author | Kim, Joungho | ko |
dc.date.accessioned | 2023-10-16T06:02:04Z | - |
dc.date.available | 2023-10-16T06:02:04Z | - |
dc.date.created | 2023-10-16 | - |
dc.date.issued | 2015-01 | - |
dc.identifier.citation | DesignCon 2015 | - |
dc.identifier.uri | http://hdl.handle.net/10203/313372 | - |
dc.description.abstract | A new modeling method is proposed to estimate the electromagnetic noise effects on an ADC in the electric vehicle. We focus on two noise sources; one is the switching noise from the automotive inverter. Second is the magnetic coupled noise from power circuit such as wireless power transmission. The ADC is fabricated using a 0.13-μm CMOS process, and the ADC is designed with a 4-layer stack-up PCB. The proposed model dramatically reduces the necessary computation time and resources without losing estimation accuracy. The proposed model is a new approach to the automotive semiconductor EMC. | - |
dc.language | English | - |
dc.publisher | UBM Electronics | - |
dc.title | Electromagnetic noise effects on semiconductor system in electric vehicle | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-84983201131 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | DesignCon 2015 | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Santa Clara | - |
dc.contributor.localauthor | Kim, Joungho | - |
dc.contributor.nonIdAuthor | Bae, Bumhee | - |
dc.contributor.nonIdAuthor | Kim, Sukjin | - |
dc.contributor.nonIdAuthor | Jung, Daniel H | - |
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