Reliability-Enhanced Camera Lens Module Classification Using Semi-Supervised Regression Method

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dc.contributor.authorKim, Sung Wookko
dc.contributor.authorLee, Young Gonko
dc.contributor.authorTama, Bayu Adhiko
dc.contributor.authorLee, Seungchulko
dc.date.accessioned2023-09-13T01:01:39Z-
dc.date.available2023-09-13T01:01:39Z-
dc.date.created2023-09-13-
dc.date.created2023-09-13-
dc.date.issued2020-06-
dc.identifier.citationAPPLIED SCIENCES-BASEL, v.10, no.11-
dc.identifier.urihttp://hdl.handle.net/10203/312519-
dc.description.abstractArtificial intelligence has become the primary issue in the era of Industry 4.0, accelerating the realization of a self-driven smart factory. It is transforming various manufacturing sectors including the assembly line for a camera lens module. The recent development of bezel-less smartphones necessitates a large-scale production of the camera lens module. However, assembling the necessary parts of a module needs much room to be improved since the procedure followed by its inspection is costly and time-consuming. Consequently, the collection of labeled data is often limited. In this study, a reliable means to predict the state of an unseen camera lens module using simple semi-supervised regression is proposed. Here, an experimental study to investigate the effect of different numbers of training samples is demonstrated. The increased amount of data using simple pseudo-labeling means is shown to improve the general performance of deep neural network for the prediction of Modulation Transfer Function (MTF) by as much as 18%, 15% and 25% in terms of RMSE, MAE and R squared. The cross-validation technique is used to ensure a generalized predictive performance. Furthermore, binary classification is conducted based on a threshold value for MTF to finally demonstrate the better prediction outcome in a real-world scenario. As a result, the overall accuracy, recall, specificity and f1-score are increased by 11.3%, 9%, 1.6% and 7.6% showing that the classification of camera lens module has been improved through the suggested semi-supervised regression method.-
dc.languageEnglish-
dc.publisherMDPI-
dc.titleReliability-Enhanced Camera Lens Module Classification Using Semi-Supervised Regression Method-
dc.typeArticle-
dc.identifier.wosid000543385900169-
dc.identifier.scopusid2-s2.0-85086110078-
dc.type.rimsART-
dc.citation.volume10-
dc.citation.issue11-
dc.citation.publicationnameAPPLIED SCIENCES-BASEL-
dc.identifier.doi10.3390/app10113832-
dc.contributor.localauthorLee, Seungchul-
dc.contributor.nonIdAuthorKim, Sung Wook-
dc.contributor.nonIdAuthorLee, Young Gon-
dc.contributor.nonIdAuthorTama, Bayu Adhi-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorsemi-supervised regression-
dc.subject.keywordAuthorcamera lens module-
dc.subject.keywordAuthorpseudo-label-
dc.subject.keywordAuthordeep neural network-
dc.subject.keywordAuthormodular transfer function-
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