Detection of open and short faults in 3D-ICs based on through silicon via (TSV)
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Piersanti, Stefano | ko |
| dc.contributor.author | De Paulis, Francesco | ko |
| dc.contributor.author | Orlandi, Antonio | ko |
| dc.contributor.author | Jung, Daniel Hyunsuk | ko |
| dc.contributor.author | Kim, Joungho | ko |
| dc.contributor.author | Fan, Jun | ko |
| dc.date.accessioned | 2023-08-30T03:01:45Z | - |
| dc.date.available | 2023-08-30T03:01:45Z | - |
| dc.date.created | 2023-07-06 | - |
| dc.date.issued | 2017-08 | - |
| dc.identifier.citation | IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017, pp.405 - 410 | - |
| dc.identifier.issn | 1077-4076 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/311978 | - |
| dc.description.abstract | This paper proposes a procedure for estimating the location of open or short defects in a Through Silicon Via daisy-chain structure. The equivalent inductance and capacitance are extracted, at low frequency, through the measured and/or computed Z11 parameter of a three dimensional model in which the short and open defects are intentionally created in specific points. | - |
| dc.language | English | - |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
| dc.title | Detection of open and short faults in 3D-ICs based on through silicon via (TSV) | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000428753300229 | - |
| dc.identifier.scopusid | 2-s2.0-85039165165 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 405 | - |
| dc.citation.endingpage | 410 | - |
| dc.citation.publicationname | IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Washington, DC | - |
| dc.identifier.doi | 10.1109/ISEMC.2017.8077904 | - |
| dc.contributor.localauthor | Kim, Joungho | - |
| dc.contributor.nonIdAuthor | Piersanti, Stefano | - |
| dc.contributor.nonIdAuthor | De Paulis, Francesco | - |
| dc.contributor.nonIdAuthor | Orlandi, Antonio | - |
| dc.contributor.nonIdAuthor | Fan, Jun | - |
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