Quantum Dot/Siloxane Composite Film Exceptionally Stable Against Heat and Moisture
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Hwea Yoon | ko |
| dc.contributor.author | Yoon, Da-Eun | ko |
| dc.contributor.author | Jang, Junho | ko |
| dc.contributor.author | Choi, Gwang-Mun | ko |
| dc.contributor.author | Lee, Doh Chang | ko |
| dc.contributor.author | Bae, Byeong-Soo | ko |
| dc.date.accessioned | 2023-08-21T08:00:50Z | - |
| dc.date.available | 2023-08-21T08:00:50Z | - |
| dc.date.created | 2023-07-06 | - |
| dc.date.issued | 2017-05 | - |
| dc.identifier.citation | SID Symposium, Seminar, and Exhibition 2017, Display Week 2017, pp.451 - 454 | - |
| dc.identifier.issn | 0097-966X | - |
| dc.identifier.uri | http://hdl.handle.net/10203/311682 | - |
| dc.description.abstract | We report the siloxane-encapsulated quantum dot (QD) film (QD/siloxane film), whose photoluminescence (PL) quantum yield (QY) remains nearly undegraded under harsh heat or moisture conditions; 85 °C/5% relative humidity (RH) and 85 °C/85% RH for over 1 month. | - |
| dc.language | English | - |
| dc.publisher | John Wiley and Sons Inc | - |
| dc.title | Quantum Dot/Siloxane Composite Film Exceptionally Stable Against Heat and Moisture | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-85094210697 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 451 | - |
| dc.citation.endingpage | 454 | - |
| dc.citation.publicationname | SID Symposium, Seminar, and Exhibition 2017, Display Week 2017 | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Los Angeles, CA | - |
| dc.identifier.doi | 10.1002/SDTP.11643 | - |
| dc.contributor.localauthor | Lee, Doh Chang | - |
| dc.contributor.localauthor | Bae, Byeong-Soo | - |
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