Modeling and Analysis of High Speed Switching Buck Converter IC for Conducted Emission Estimation

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dc.contributor.authorPark, Jaehyoungko
dc.contributor.authorSong, Chiukko
dc.contributor.authorPark, Jonghyunko
dc.contributor.authorKweon, Hycksuko
dc.contributor.authorAhn, Seungyoungko
dc.contributor.authorFan, Junko
dc.contributor.authorKim, Hongseokko
dc.date.accessioned2023-08-08T09:00:37Z-
dc.date.available2023-08-08T09:00:37Z-
dc.date.created2023-07-07-
dc.date.created2023-07-07-
dc.date.issued2020-09-
dc.identifier.citation2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020-
dc.identifier.urihttp://hdl.handle.net/10203/311257-
dc.description.abstractIndexed keywords SciVal Topics Metrics Funding details Abstract The high speed switching buck converter is widely used to reduce the cost and to improve the transient response. However, the switching voltage noise from high speed switching buck converter can be a potential problem such as conducted emission (CE) and radiated emission (RE) because of its high speed switching characteristics. The estimation of switching voltage noise from high speed switching buck converter is important to predict the impact on other device. In this paper, the modeling method of high speed switching buck converter based on the analysis of noise path is proposed so that the switching voltage from buck converter can be estimated and simulated more fast and simple without using SPICE model of buck converter IC. The proposed modeling method can replicate switching voltage in frequency domain and time domain.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleModeling and Analysis of High Speed Switching Buck Converter IC for Conducted Emission Estimation-
dc.typeConference-
dc.identifier.wosid000861792600054-
dc.identifier.scopusid2-s2.0-85097186595-
dc.type.rimsCONF-
dc.citation.publicationname2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020-
dc.identifier.conferencecountryIT-
dc.identifier.conferencelocationRome-
dc.identifier.doi10.1109/EMCEUROPE48519.2020.9245679-
dc.contributor.localauthorAhn, Seungyoung-
dc.contributor.nonIdAuthorSong, Chiuk-
dc.contributor.nonIdAuthorPark, Jonghyun-
dc.contributor.nonIdAuthorKweon, Hycksu-
dc.contributor.nonIdAuthorFan, Jun-
dc.contributor.nonIdAuthorKim, Hongseok-
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