DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | Yoo, Shin | - |
dc.contributor.advisor | 유신 | - |
dc.contributor.author | Yoon, Juyeon | - |
dc.date.accessioned | 2023-06-26T19:31:35Z | - |
dc.date.available | 2023-06-26T19:31:35Z | - |
dc.date.issued | 2022 | - |
dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=997588&flag=dissertation | en_US |
dc.identifier.uri | http://hdl.handle.net/10203/309553 | - |
dc.description | 학위논문(석사) - 한국과학기술원 : 전산학부, 2022.2,[iii, 23 p. :] | - |
dc.description.abstract | Failure clustering aims to group multiple test failures based on shared root causes, helping developers to comprehend and debug each root cause (i.e., the underlying fault) in isolation. Clustering of failing test executions requires distances between those executions, for which distance measures between coverage vectors are widely used. Lexical representation of coverage has been suggested as an alternative, representing each structural element covered by an execution with the lexical tokens in the element. This paper investigates whether the granularity of the lexical representation affects the effectiveness of the failure clustering. We evaluate varying levels of tokenisation granularity by using them for clustering coexisting real-world test failures in Defects4J benchmark. Our results show that the traditionally adopted subtokenisation can actually deconstruct larger meaningful semantic token units, resulting in suboptimal clustering. We further suggest a novel tokenisation strategy based on the semantically similar line groups. | - |
dc.language | eng | - |
dc.publisher | 한국과학기술원 | - |
dc.title | Enhancing lexical representation of test coverage for failure clustering | - |
dc.title.alternative | 다중 실행 오류 클러스터링을 위한 테스트 커버리지의 어휘적 표현 향상 | - |
dc.type | Thesis(Master) | - |
dc.identifier.CNRN | 325007 | - |
dc.description.department | 한국과학기술원 :전산학부, | - |
dc.contributor.alternativeauthor | 윤주연 | - |
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