Given the low absorption contrast of X-rays, phase shift has been playing an important role as an alternative source of contrast in X-ray nanoimaging. Numerous phase-measuring techniques have been proposed, most of which, however, are based on significant assumptions or sample translations. In this study, we propose the application of Kramers- Kronig (KK) relations in the spatial domain as a solution to allow the X-ray quantitative phase image to be directly calculated from the measured intensity image without any additional requirements. Based on this straightforward principle, we have presented KK nanotomography by introducing a spatial-frequency cutoff filter into a conventional tomographic setup. The robustness and versatility of the proposed method were experimentally verified based on various sample tomograms. We expect KK nanotomography to be widely adopted as a powerful and easy-to-adapt phase quantification solution for X-ray microscopes. (c) 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement