DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Yongman | ko |
dc.contributor.author | Choi, Joong Il Jake | ko |
dc.contributor.author | Jeong, Yongchan | ko |
dc.contributor.author | Kim, Young Jae | ko |
dc.contributor.author | Park, Jeong Young | ko |
dc.date.accessioned | 2023-05-15T03:00:37Z | - |
dc.date.available | 2023-05-15T03:00:37Z | - |
dc.date.created | 2023-05-15 | - |
dc.date.created | 2023-05-15 | - |
dc.date.issued | 2023-06 | - |
dc.identifier.citation | CURRENT APPLIED PHYSICS, v.50, pp.74 - 80 | - |
dc.identifier.issn | 1567-1739 | - |
dc.identifier.uri | http://hdl.handle.net/10203/306829 | - |
dc.description.abstract | In this paper, we present the design and performances of a beetle-type electrochemical scanning tunneling microscope (EC-STM) which allows horizontal tip motion at millimeter range (5 mm x 5 mm). With its symmetrical scanner design inducing a relatively low thermal drift, the beetle-type EC-STM has the desirable ability to operate in a variety of chemical reactions. Atom-resolved high-resolution STM images of highly oriented pyrolytic graphite (HOPG) and Au(111) surfaces in the liquid phase are presented to confirm the scan performance of the beetle-type EC-STM, which also provides in situ information on the electrode surface during electrochemical reactions, including adsorbed- and desorbed- electrolyte and metal electrodeposition. These systemically obtained STM images on the electrode surface clearly demonstrate the high stability of the newly developed ECSTM under reaction conditions. | - |
dc.language | English | - |
dc.publisher | ELSEVIER | - |
dc.title | In-situ imaging of the electrode surface during electrochemical reactions with a beetle-type electrochemical scanning tunneling microscope | - |
dc.title.alternative | In-situ imaging of the electrode surface during electrochemical reactions with a beetle-type electrochemical scanning tunneling microscope | - |
dc.type | Article | - |
dc.identifier.wosid | 000975164600001 | - |
dc.identifier.scopusid | 2-s2.0-85151504448 | - |
dc.type.rims | ART | - |
dc.citation.volume | 50 | - |
dc.citation.beginningpage | 74 | - |
dc.citation.endingpage | 80 | - |
dc.citation.publicationname | CURRENT APPLIED PHYSICS | - |
dc.identifier.doi | 10.1016/j.cap.2023.03.016 | - |
dc.identifier.kciid | ART002973064 | - |
dc.contributor.localauthor | Park, Jeong Young | - |
dc.contributor.nonIdAuthor | Choi, Joong Il Jake | - |
dc.contributor.nonIdAuthor | Jeong, Yongchan | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Electrochemistry | - |
dc.subject.keywordAuthor | Electrodeposition | - |
dc.subject.keywordAuthor | Electrochemical scanning tunneling | - |
dc.subject.keywordAuthor | microscopy | - |
dc.subject.keywordPlus | RECONSTRUCTED AU(111) SURFACE | - |
dc.subject.keywordPlus | LOW-TEMPERATURE | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordPlus | STM | - |
dc.subject.keywordPlus | DIRECTION | - |
dc.subject.keywordPlus | LIQUID | - |
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