In-situ imaging of the electrode surface during electrochemical reactions with a beetle-type electrochemical scanning tunneling microscopeIn-situ imaging of the electrode surface during electrochemical reactions with a beetle-type electrochemical scanning tunneling microscope

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dc.contributor.authorKim, Yongmanko
dc.contributor.authorChoi, Joong Il Jakeko
dc.contributor.authorJeong, Yongchanko
dc.contributor.authorKim, Young Jaeko
dc.contributor.authorPark, Jeong Youngko
dc.date.accessioned2023-05-15T03:00:37Z-
dc.date.available2023-05-15T03:00:37Z-
dc.date.created2023-05-15-
dc.date.created2023-05-15-
dc.date.issued2023-06-
dc.identifier.citationCURRENT APPLIED PHYSICS, v.50, pp.74 - 80-
dc.identifier.issn1567-1739-
dc.identifier.urihttp://hdl.handle.net/10203/306829-
dc.description.abstractIn this paper, we present the design and performances of a beetle-type electrochemical scanning tunneling microscope (EC-STM) which allows horizontal tip motion at millimeter range (5 mm x 5 mm). With its symmetrical scanner design inducing a relatively low thermal drift, the beetle-type EC-STM has the desirable ability to operate in a variety of chemical reactions. Atom-resolved high-resolution STM images of highly oriented pyrolytic graphite (HOPG) and Au(111) surfaces in the liquid phase are presented to confirm the scan performance of the beetle-type EC-STM, which also provides in situ information on the electrode surface during electrochemical reactions, including adsorbed- and desorbed- electrolyte and metal electrodeposition. These systemically obtained STM images on the electrode surface clearly demonstrate the high stability of the newly developed ECSTM under reaction conditions.-
dc.languageEnglish-
dc.publisherELSEVIER-
dc.titleIn-situ imaging of the electrode surface during electrochemical reactions with a beetle-type electrochemical scanning tunneling microscope-
dc.title.alternativeIn-situ imaging of the electrode surface during electrochemical reactions with a beetle-type electrochemical scanning tunneling microscope-
dc.typeArticle-
dc.identifier.wosid000975164600001-
dc.identifier.scopusid2-s2.0-85151504448-
dc.type.rimsART-
dc.citation.volume50-
dc.citation.beginningpage74-
dc.citation.endingpage80-
dc.citation.publicationnameCURRENT APPLIED PHYSICS-
dc.identifier.doi10.1016/j.cap.2023.03.016-
dc.identifier.kciidART002973064-
dc.contributor.localauthorPark, Jeong Young-
dc.contributor.nonIdAuthorChoi, Joong Il Jake-
dc.contributor.nonIdAuthorJeong, Yongchan-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorElectrochemistry-
dc.subject.keywordAuthorElectrodeposition-
dc.subject.keywordAuthorElectrochemical scanning tunneling-
dc.subject.keywordAuthormicroscopy-
dc.subject.keywordPlusRECONSTRUCTED AU(111) SURFACE-
dc.subject.keywordPlusLOW-TEMPERATURE-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordPlusSTM-
dc.subject.keywordPlusDIRECTION-
dc.subject.keywordPlusLIQUID-
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