DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Hyunwook | ko |
dc.contributor.author | Kim, Joungho | ko |
dc.contributor.author | Kim, Keunwoo | ko |
dc.contributor.author | Sim, BooGyo | ko |
dc.contributor.author | Lho, Daehwan | ko |
dc.contributor.author | Shin, TaeIn | ko |
dc.contributor.author | Son, Keeyoung | ko |
dc.contributor.author | Song, Jinwook | ko |
dc.date.accessioned | 2023-02-02T08:00:47Z | - |
dc.date.available | 2023-02-02T08:00:47Z | - |
dc.date.created | 2023-01-25 | - |
dc.date.issued | 2021-10-17 | - |
dc.identifier.citation | 30th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2021 | - |
dc.identifier.issn | 2165-4107 | - |
dc.identifier.uri | http://hdl.handle.net/10203/304975 | - |
dc.description.abstract | In this paper, we first propose a crosstalk-included pulse amplitude modulation-4 (PAM-4) worst eye diagram estimation method. The proposed method is based on the conventional peak distortion analysis (PDA) method. Compared to the non-return-to-zero (NRZ), the PAM-4 has 3 single bit responses (SBRs) due to the 4-level amplitude modulation. To consider worst crosstalk effects, the main idea is to take 3-level transition crosstalk responses as input when estimating each level-transition worst eyes by the PDA. By superposition of the estimated 1-level, 2-level and 3-level worst eyes, a PAM-4 worst eye contour can be provided as an innermost contour. For verification, we compared the estimated PAM-4 worst eye diagrams with those at bit-error-ratio (BER) 10-12 by the statistical eye simulator using input output buffer information specification-algorithmic modeling interface (IBIS-AMI). We compared the results in various cases: with 1 near-end crosstalk (NEXT) aggressor (aggr); with 1 NEXT and 1 far-end crosstalk (FEXT) aggrs; with 2 NEXT and 1 FEXT aggrs. The error rates of eye widths and heights between the proposed method and the simulator were 6.3 % and 4 % respectively. Moreover, we compared the computing time. The computing time of the proposed method was within 50 ms in all the cases, however that of the simulator increases from 10.5 s to 21.7 s as the number of aggrs increases. | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | Crosstalk-included PAM-4 Worst Eye Diagram Estimation Method for High-speed Serial Links | - |
dc.type | Conference | - |
dc.identifier.wosid | 000758515900002 | - |
dc.identifier.scopusid | 2-s2.0-85123181377 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 30th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2021 | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Austin | - |
dc.identifier.doi | 10.1109/EPEPS51341.2021.9609114 | - |
dc.contributor.localauthor | Kim, Joungho | - |
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